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Selection of the eddy currents frequency for conductivity measurements in two‐layer structures
Author(s) -
Dziczkowski Leszek
Publication year - 2009
Publication title -
pamm
Language(s) - English
Resource type - Journals
ISSN - 1617-7061
DOI - 10.1002/pamm.200910068
Subject(s) - eddy current , electrical conductor , conductivity , eddy current testing , materials science , delamination (geology) , layer (electronics) , electrical resistivity and conductivity , composite material , geology , electrical engineering , physics , engineering , paleontology , subduction , quantum mechanics , tectonics
Abstract Conductance measurements of conductive parts can serve as a background for conclusion about structure of material and possible defects (e.g. fractures, fissures, delamination, flaking, etc.) that may occur in examined parts. When the need arises to test surfaces of parts that are made of a conductive but non‐ferromagnetic material, the method of eddy currents offers unsurpassed advantages. The problem refers to application of the eddy current method to examination of conductive material coated with conductive films. The major outcome consists in development of a very simple and useful mathematical model that can be used to determine conductivity of the deep layer for the needs of non‐destructive tests. (© 2009 Wiley‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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