A coupled MD–FE approach for contact at microscopic length–scales (Poster Presentation) | Zendy

Helmich Tobias | Zendy; Nackenhorst Udo | Zendy

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A coupled MD–FE approach for contact at microscopic length–scales (Poster Presentation)

Author(s) -

Helmich Tobias,

Nackenhorst Udo

Publication year - 2007

Publication title -

pamm

Language(s) - English

Resource type - Journals

ISSN - 1617-7061

DOI - 10.1002/pamm.200700977

Subject(s) - discretization , atomic force microscopy , molecular dynamics , convergence (economics) , atomic units , finite element method , statistical physics , scale (ratio) , length scale , nanotechnology , physics , materials science , computer science , chemistry , mechanics , mathematics , computational chemistry , thermodynamics , mathematical analysis , quantum mechanics , economic growth , economics

Contact at very tiny length–scales is characterized by atomic force interaction. A technical application of interest is the atomic force microscope (AFM). A coupled molecular dynamics (MD) – finite element (FE) approach is outlined to tackle the multi–scale problem by numerical simulation. Guidelines for the spatial discretization are derived from convergence studies. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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