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Integrated circuit design: dealing with variations
Author(s) -
Schlichtmann Ulf,
Graeb Helmut
Publication year - 2007
Publication title -
pamm
Language(s) - English
Resource type - Journals
ISSN - 1617-7061
DOI - 10.1002/pamm.200700215
Subject(s) - yield (engineering) , circuit design , computer science , physical design , integrated circuit , electronic circuit , circuit extraction , spec# , electronic engineering , computer engineering , reliability engineering , equivalent circuit , engineering , embedded system , electrical engineering , programming language , materials science , voltage , metallurgy , operating system
In the following, a practicable methodology to analyze and optimize the yield of an electronic circuit, i.e. the percentage of manufactured circuits that satisfy the circuit specification, is formulated. It is based on a “spec‐wise” partitioning of the problem by considering each circuit specification bound individually, and on a geometric yield approximation. EDA tools following the described approach are available meanwhile. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)