Integrated circuit design: dealing with variations | Zendy

Schlichtmann Ulf | Zendy; Graeb Helmut | Zendy

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Integrated circuit design: dealing with variations

Author(s) -

Schlichtmann Ulf,

Graeb Helmut

Publication year - 2007

Publication title -

pamm

Language(s) - English

Resource type - Journals

ISSN - 1617-7061

DOI - 10.1002/pamm.200700215

Subject(s) - yield (engineering) , circuit design , computer science , physical design , integrated circuit , electronic circuit , circuit extraction , spec# , electronic engineering , computer engineering , reliability engineering , equivalent circuit , engineering , embedded system , electrical engineering , programming language , materials science , voltage , metallurgy , operating system

In the following, a practicable methodology to analyze and optimize the yield of an electronic circuit, i.e. the percentage of manufactured circuits that satisfy the circuit specification, is formulated. It is based on a “spec‐wise” partitioning of the problem by considering each circuit specification bound individually, and on a geometric yield approximation. EDA tools following the described approach are available meanwhile. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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