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Numerical Simulation of Surface Scanning in an Atomic Force Microscope Environment
Author(s) -
Helmich Tobias,
Nackenhorst Udo
Publication year - 2006
Publication title -
pamm
Language(s) - English
Resource type - Journals
ISSN - 1617-7061
DOI - 10.1002/pamm.200610203
Subject(s) - multiphysics , finite element method , atomic force microscopy , nonlinear system , coupling (piping) , surface (topology) , nanotechnology , microscope , mechanics , mechanical engineering , materials science , classical mechanics , computer science , physics , engineering , optics , geometry , mathematics , thermodynamics , quantum mechanics
In this contribution a model for the numerical simulation of an atomic force microscope (AFM) is presented. A challenge of this goal is the treatment of the multiphysics phenomena on the microscopic length‐scale. Hence a coupled strategy is required to incorporate the different physically aspects and their interactions. The strategy is embedded in a nonlinear finite element formulation, where the different aspects are tackled by direct and weak coupling. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)