Numerical Simulation of Surface Scanning in an Atomic Force Microscope Environment | Zendy

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Numerical Simulation of Surface Scanning in an Atomic Force Microscope Environment

Author(s) -

Helmich Tobias,

Nackenhorst Udo

Publication year - 2006

Publication title -

pamm

Language(s) - English

Resource type - Journals

ISSN - 1617-7061

DOI - 10.1002/pamm.200610203

Subject(s) - multiphysics , finite element method , atomic force microscopy , nonlinear system , coupling (piping) , surface (topology) , nanotechnology , microscope , mechanics , mechanical engineering , materials science , classical mechanics , computer science , physics , engineering , optics , geometry , mathematics , thermodynamics , quantum mechanics

In this contribution a model for the numerical simulation of an atomic force microscope (AFM) is presented. A challenge of this goal is the treatment of the multiphysics phenomena on the microscopic length‐scale. Hence a coupled strategy is required to incorporate the different physically aspects and their interactions. The strategy is embedded in a nonlinear finite element formulation, where the different aspects are tackled by direct and weak coupling. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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