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Modeling of Electromechanical Contact on a Microscopic Lengthscale
Author(s) -
Helmich Tobias,
Nackenhorst Udo
Publication year - 2005
Publication title -
pamm
Language(s) - English
Resource type - Journals
ISSN - 1617-7061
DOI - 10.1002/pamm.200510180
Subject(s) - finite element method , atomic force microscopy , contact force , surface (topology) , contact angle , mechanics , materials science , mechanical engineering , nanotechnology , physics , classical mechanics , engineering , structural engineering , composite material , geometry , mathematics
This paper treats the simulation of the contact mode of an atomic force microscope (AFM). The contact forces between the tip and the sample surface is calculated via the van derWaals force in a Finite Element approach, the integration of the contact force a FEM environment is discussed and numerical examples are presented. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)