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Reliability of Deterioration System
Author(s) -
Sniady Pawel,
Sieniawska Roza,
Zukowski Stanislaw
Publication year - 2004
Publication title -
pamm
Language(s) - English
Resource type - Journals
ISSN - 1617-7061
DOI - 10.1002/pamm.200410283
Subject(s) - reliability (semiconductor) , degradation (telecommunications) , reliability engineering , stochastic modelling , structural reliability , computer science , engineering , mathematics , statistics , thermodynamics , physics , probabilistic logic , artificial intelligence , telecommunications , power (physics)
Mathematical models of the reliability assessment of a structure treated as the time to the first passage of the capacity which is degrading in the time are presented. Two stochastic models of the structure degradation caused by different factors and two stochastic models of loading are considered. The relationships for calculating the probability of failure for presented models of the structure load and the capacity degradation, are given. (© 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)