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Damage identification by wavelet transformation of data measured in thermal processes
Author(s) -
Pozorski Zbigniew,
Ziopaja Krzysztof
Publication year - 2004
Publication title -
pamm
Language(s) - English
Resource type - Journals
ISSN - 1617-7061
DOI - 10.1002/pamm.200410186
Subject(s) - wavelet , transformation (genetics) , wavelet transform , transient (computer programming) , identification (biology) , noise (video) , thermal , field (mathematics) , materials science , pattern recognition (psychology) , computer science , artificial intelligence , mathematics , physics , thermodynamics , chemistry , biochemistry , botany , biology , pure mathematics , image (mathematics) , gene , operating system
Damage detection by the analysis of steady‐state or transient thermal response of a structure is studied. 2D‐wavelet transform is employed. Measurement noise in temperature field is accounted for. (© 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)