Damage identification by wavelet transformation of data measured in thermal processes | Zendy

Pozorski Zbigniew | Zendy; Ziopaja Krzysztof | Zendy

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Damage identification by wavelet transformation of data measured in thermal processes

Author(s) -

Pozorski Zbigniew,

Ziopaja Krzysztof

Publication year - 2004

Publication title -

pamm

Language(s) - English

Resource type - Journals

ISSN - 1617-7061

DOI - 10.1002/pamm.200410186

Subject(s) - wavelet , transformation (genetics) , wavelet transform , transient (computer programming) , identification (biology) , noise (video) , thermal , field (mathematics) , materials science , pattern recognition (psychology) , computer science , artificial intelligence , mathematics , physics , thermodynamics , chemistry , biochemistry , botany , biology , pure mathematics , image (mathematics) , gene , operating system

Damage detection by the analysis of steady‐state or transient thermal response of a structure is studied. 2D‐wavelet transform is employed. Measurement noise in temperature field is accounted for. (© 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)

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