Open AccessEMVA Young Professional Award 2017
Author(s) -
Breyer Andreas
Publication year - 2017
Publication title -
optik & photonik
Language(s) - English
Resource type - Journals
eISSN - 2191-1975
pISSN - 1863-1460
DOI - 10.1002/opph.201790026
Subject(s) - citation , library science , computer science
The EMVA Young Professional Award 2019 goes to Dr. Ing. Johannes Meyer for his work "Light Field Methods for the Visual Inspection of Transparent Objects". Johannes Meyer, 31 years old, completed his Bachelor and Master studies in Computer Science at the Karlsruhe Institute of Technology (KIT) from 2008 to 2014. He then worked as a research associate in close cooperation between the Department of Interactive Real-Time Systems (IES) of the KIT and the Visual Inspection Systems Division of the Fraunhofer Institute for Optronics, Systems Engineering and Image Evaluation (IOSB). At the end of 2018, he was appointed Dr.-Ing. For his research by the computer science faculty of KIT. PhD. Since then he has worked for ITK Engineering GmbH in the field of computer vision.