Open AccessCommercial Tests and Assembly in Silicon Photonics
Author(s) -
Jordan Scott
Publication year - 2017
Publication title -
optik & photonik
Language(s) - English
Resource type - Journals
eISSN - 2191-1975
pISSN - 1863-1460
DOI - 10.1002/opph.201700017
Subject(s) - photonics , silicon photonics , bandwidth (computing) , scalability , computer science , telecommunications , engineering , nanotechnology , materials science , optoelectronics , database
As the world's appetite for data skyrockets, silicon photonics (SiP) promises fresh bounties of bandwidth, scalability and energy efficiency. The transformation of data transmission (and, soon, computational processes) from electronic to photonic is comparable to the development in integrated circuitry five decades ago: It is a fundamental shift that marks a watershed moment in the history of technology. However, there are many challenges to overcome to enable the practical, profitable manufacturing and testing of silicon photonic devices. Escalating demand – combined with the fundamental need for nanoscale‐accurate mutual orientation of miniscule photonic elements – necessitates robust, fast automation solutions.