Open AccessAutomatic Testing of Photonics Components
Author(s) -
Arnold Steffen
Publication year - 2016
Publication title -
optik & photonik
Language(s) - English
Resource type - Journals
eISSN - 2191-1975
pISSN - 1863-1460
DOI - 10.1002/opph.201600026
Subject(s) - terabit , photonics , computer science , cloud computing , the internet , transmission (telecommunications) , data transmission , silicon photonics , production (economics) , optical fiber , electronic engineering , telecommunications , computer hardware , engineering , wavelength division multiplexing , operating system , materials science , optoelectronics , wavelength , economics , macroeconomics
Silicon photonics sets the pace on the fiber optic data highway. Cloud computing, server farms, big data, fast Internet access, as well as a large number of other computer‐supported services that demand high transmission speeds, benefit from data rates in the Tbit/s range. However, a number of challenges must be overcome for production and testing of the latest generation of silicon photonics wafers. Automated solutions must function reliably under industrial conditions and work around‐the‐clock with great accuracy. At the same time, individual solutions are required because the wafer can make very different demands on the testing and production equipment.