Open AccessTesting and Pushing the Limits of Super‐Resolution Microscopy
Author(s) -
Schmied Jürgen
Publication year - 2016
Publication title -
optik & photonik
Language(s) - English
Resource type - Journals
eISSN - 2191-1975
pISSN - 1863-1460
DOI - 10.1002/opph.201600013
Subject(s) - resolution (logic) , microscope , microscopy , super resolution microscopy , image resolution , fiducial marker , optics , photoactivated localization microscopy , diffraction , fluorescence microscope , nanotechnology , computer science , materials science , computer vision , artificial intelligence , physics , fluorescence , scanning confocal electron microscopy
Abstract In recent years, the spatial resolution in fluorescence microscopy has seen a dramatic improvement due to the invention of several super‐resolution techniques which break the diffraction limit. However, validating and testing these new techniques remains challenging due to the lack of reliable test‐structures providing well‐defined mark‐to‐mark distances. Newly developed nanostructures allow to position dye molecules with nanometer precision and can be produced in a highly parallel fashion. These structures can be used to test the achievable spatial resolution of super‐resolution but also of conventional fluorescence microscopes. Furthermore, a new type of ideal fiducial marker will be presented, which helps to push the resolution of localization based microscopes to its limits.