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Negative‐ion fast atom bombardment mass spectrometry in the characterization of deoxyfluorinated sugars
Author(s) -
Coppola M.,
Favretto D.,
Traldi P.,
Resnati G.
Publication year - 1994
Publication title -
organic mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.475
H-Index - 121
eISSN - 1096-9888
pISSN - 0030-493X
DOI - 10.1002/oms.1210291007
Subject(s) - fast atom bombardment , fragmentation (computing) , mass spectrometry , fluorine , ion , chemistry , metastability , characterization (materials science) , decomposition , secondary ion mass spectrometry , atom (system on chip) , analytical chemistry (journal) , materials science , organic chemistry , chromatography , nanotechnology , computer science , operating system , embedded system
Negative‐ion fast atom bombardment mass spectrometry and metastable ion studies were applied to the characterization of three isomeric fluorine‐containing sugars. Peculiar fragmentation processes were evidenced for each isomer, enabling their differentiation. Comparison with the behaviour of a non‐fluorinated analogue allowed investigation of the role of fluorine in the decomposition processes of these compounds.