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Laser‐induced electron impact ionization in a reflectron time‐of‐flight mass spectrometer
Author(s) -
Moritz F.,
Dey M.,
Zipperer K.,
Prinke S.,
Grotemeyer J.
Publication year - 1993
Publication title -
organic mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.475
H-Index - 121
eISSN - 1096-9888
pISSN - 0030-493X
DOI - 10.1002/oms.1210281218
Subject(s) - reflectron , mass spectrometry , time of flight , laser , electron , ionization , atomic physics , hybrid mass spectrometer , mass spectrum , time of flight mass spectrometry , ion source , electron ionization , ion , atmospheric pressure laser ionization , spectrometer , materials science , chemistry , optics , physics , selected reaction monitoring , nuclear physics , tandem mass spectrometry , organic chemistry , chromatography
Some details of the generation of electrons by impinging a laser beam on a metal surface are described. It is shown that highly efficient electron generation is observed only during the laser pulse. Therefore, this technique delivers intense pulses of electrons. The process is investigated and different ion source set‐ups are discussed. In conjunction with a time‐of‐flight mass spectrometer this technique can be used to produce mass spectra of different samples ranging from simple organic molecules to peptides.