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Analysis of xanthates by negative‐ion fast atom bombardment mass spectrometry
Author(s) -
Fourie L.,
Kruger H. G.
Publication year - 1993
Publication title -
organic mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.475
H-Index - 121
eISSN - 1096-9888
pISSN - 0030-493X
DOI - 10.1002/oms.1210281106
Subject(s) - fast atom bombardment , mass spectrometry , ion , chemistry , electron ionization , ionization , static secondary ion mass spectrometry , atom (system on chip) , chemical ionization , secondary ion mass spectrometry , analytical chemistry (journal) , chromatography , organic chemistry , computer science , embedded system
Abstract A new technique using negative‐ion fast atom bombardment mass spectrometry for the analysis of xanthates and related compounds is described. Electron impact and positive‐ion fast atom bombardment mass spectrometry produced no structurally related fragment ions or observable molecular ions at the expected m / z values. It was demonstrated that negative‐ion fast atom bombardment ionization was the most suitable method of ionization for structure elucidation studies for the compounds described.