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Calibration in positive and negative ion fast atom bombardment using salt mixtures
Author(s) -
Vékey Károly
Publication year - 1989
Publication title -
organic mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.475
H-Index - 121
eISSN - 1096-9888
pISSN - 0030-493X
DOI - 10.1002/oms.1210240308
Subject(s) - ion , calibration , fast atom bombardment , atom (system on chip) , mode (computer interface) , range (aeronautics) , salt (chemistry) , analytical chemistry (journal) , chemistry , atomic physics , materials science , physics , chromatography , computer science , organic chemistry , quantum mechanics , composite material , embedded system , operating system
Two salt mixtures are described far mass calibration in fast atom bombardment: CsI and NaI for positive ion mode, and CsI and CsF for negative ion mode. The mixtures give many more peaks than CsI and therefore better mass accuracy can be obtained both in scanning and in peak‐matching mode. Their use is especially advantageous for computerized data acquisition. The mass range of 23–3500 for positive ion mode, and 19–3000 for negative ion mode, has been tested and gave good results.