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Low‐resolution accurate mass measurement in self‐chemical ionization mass spectrometry
Author(s) -
Caldwell Gary W.,
Masucci John A.,
Inners Ruth R.
Publication year - 1988
Publication title -
organic mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.475
H-Index - 121
eISSN - 1096-9888
pISSN - 0030-493X
DOI - 10.1002/oms.1210230205
Subject(s) - mass spectrometry , reagent , chemistry , chemical ionization , resolution (logic) , ionization , analytical chemistry (journal) , ion , atmospheric pressure chemical ionization , molecule , protonation , thermal ionization mass spectrometry , mass spectrum , range (aeronautics) , ion source , direct electron ionization liquid chromatography–mass spectrometry interface , chromatography , materials science , organic chemistry , composite material , artificial intelligence , computer science
Low‐resolution (2000, 10% valley definition) accurate mass measurements using self‐chemical ionization (self‐CI) have been evaluated as an alternative to the conventional chemical ionization (CI) method. In conventional CI experiments a high pressure of reagent gas is required to induce ionization while in self‐CI no reagent gas is used and the self‐CI is produced presumably by molecular/fragment ion–molecule reactions. Nine compounds ranging in mass from 50–500 daltons were examined. Results obtained by the self‐CI method indicate that the elemental composition assignment can be obtained simultaneously for the protonated molecule and/or molecular ion. It is also shown that perfluorokerosene can be used routinely in self‐CI as an internal reference standard over a broad mass range (50–500 daltons). It is sometimes difficult to use a single reference standard in conventional low‐resolution CI accurate mass spectrometry over a similar mass range.