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Characterization of and energy deposition in [C 2 H 4 O 2 ] + ˙ ions using energy‐resolved mass spectrometry
Author(s) -
Jiang Y.X.,
Wood K. V.,
Cooks R. G.
Publication year - 1986
Publication title -
organic mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.475
H-Index - 121
eISSN - 1096-9888
pISSN - 0030-493X
DOI - 10.1002/oms.1210210302
Subject(s) - ion , mass spectrometry , energy (signal processing) , characterization (materials science) , deposition (geology) , molecule , analytical chemistry (journal) , atomic physics , high energy , chemistry , collision , materials science , physics , nanotechnology , geology , chromatography , organic chemistry , paleontology , computer security , quantum mechanics , sediment , computer science
Energy‐resolved mass spectrometry (ERMS) has been used to distinguish [C 2 H 4 O 2 ] + ˙ ions generated from seven precursor molecules. The low collision energy ERMS data confirm conclusions reached from previous high‐energy experiments; all seven ions have different structures or mixtures of structures. Structural distinctions are at least as easy to make using the two‐dimensional ERMS data as through collisional activation at high energy. The average internal energy deposited in low‐energy collisions (30 eV) is shown to be similar to the internal energy deposited at 8 keV in these systems.