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Selective reagents in chemical ionization mass spectrometry: Tetramethylsilane
Author(s) -
Clemens David,
Munson Burnaby
Publication year - 1985
Publication title -
organic mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.475
H-Index - 121
eISSN - 1096-9888
pISSN - 0030-493X
DOI - 10.1002/oms.1210200509
Subject(s) - tetramethylsilane , chemistry , reagent , chemical ionization , mass spectrometry , mass spectrum , ion , adduct , nitrogen , electron ionization , methane , fourier transform ion cyclotron resonance , oxygen , ionization , sulfur , analytical chemistry (journal) , inorganic chemistry , organic chemistry , chromatography
Mixtures of 50% tetramethylsilane (TMS) and methane have been found to give [M+73] + adduct ions and structurally useful fragment ions for many oxygen‐ and nitrogen‐containing organic compounds. All of the reagent ions in TMS react with polar compounds. The high‐pressure TMS chemical ionization spectra of many simple oxygenated compounds are in agreement with predictions from ion chemistry of (CH 3 ) 3 Si + obtained by ion cyclotron resonance experiments at very low pressures, but differences are noted. Sensitivities for oxygen‐, nitrogen‐, and sulfur‐containing compounds with TMS as the reagent gas appear to be approximately the same.