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Comparative study of [Xe] + and [Ar] + bombardment in secondary ion mass spectrometry for bioorganic compounds
Author(s) -
Kambara Hideki
Publication year - 1982
Publication title -
organic mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.475
H-Index - 121
eISSN - 1096-9888
pISSN - 0030-493X
DOI - 10.1002/oms.1210170105
Subject(s) - ion , chemistry , fast atom bombardment , mass spectrum , mass spectrometry , analytical chemistry (journal) , yield (engineering) , sputtering , materials science , chromatography , organic chemistry , metallurgy , thin film , nanotechnology
Secondary ion mass spectra obtained by [Xe] + bombardment are compared with those obtained by [Ar] + bombardment. Although [Ar] + ions are commonly used as primary ions in secondary ion mass spectrometry for organic compounds, [Xe] + ions seem better as primary ions because they give a larger sputtering yield for a metal substrate than [Ar] + ions. Cationized molecular intensities of sucrose, raffinose and stachyose, and quasimolecular ion intensities of tuftsin and eledoisin related peptide are investigated using [Xe] + and [Ar] + bombardments. The observed molecular species are 2–4 times more intense for [Xe] + bombardment than for [Ar] + bombardment, although the secondary ion mass spectra are almost the same in both cases.