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A small computer data system for low resolution magnetic deflection mass spectrometers
Author(s) -
Plattner J. R.,
Markey S. P.
Publication year - 1971
Publication title -
organic mass spectrometry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.475
H-Index - 121
eISSN - 1096-9888
pISSN - 0030-493X
DOI - 10.1002/oms.1210050412
Subject(s) - deflection (physics) , low resolution , mass spectrometry , resolution (logic) , physics , high resolution , computer science , optics , remote sensing , artificial intelligence , geology , quantum mechanics
A small on‐line computer system for complete processing of low resolution magnetic deflection mass spectrometric data has been demonstrated. An interpolated mass scale accuracy of 200ppm was achieved for both repetitive (five or ten second cycle times) and single scan modes. Identification of m/e values above 1000 is possible with an accuracy of 500 ppm to m/e 3600. Mass scale assignments are time based and externally calibrated (pfa).