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The modified method of characteristics with mixed finite element domain decomposition procedures for the transient behavior of a semiconductor device
Author(s) -
Yuan Yirang
Publication year - 2012
Publication title -
numerical methods for partial differential equations
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.901
H-Index - 61
eISSN - 1098-2426
pISSN - 0749-159X
DOI - 10.1002/num.20625
Subject(s) - domain decomposition methods , finite element method , norm (philosophy) , mortar methods , mathematics , transient (computer programming) , mixed finite element method , decomposition method (queueing theory) , decomposition , domain (mathematical analysis) , partial differential equation , mathematical analysis , computer science , physics , thermodynamics , chemistry , discrete mathematics , organic chemistry , political science , law , operating system
For the transient behavior of a semiconductor device, the modified method of characteristics with mixed finite element domain decomposition procedures applicable to parallel arithmetic is put forward. The electric potential equation is described by the mixed finite element method, and the electric, hole concentration and heat conduction equations are treated by the modified method of characteristics finite element domain decomposition methods. Some techniques, such as calculus of variations, domain decomposition, characteristic method, energy method, negative norm estimate and prior estimates and techniques are employed. Optimal order estimates in L 2 norm are derived for the error in the approximation solution. Thus the well‐known theoretical problem has been thoroughly and completely solved.© 2010 Wiley Periodicals, Inc. Numer Methods Partial Differential Eq 28: 353–368 2012