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Accurate stresses in the thin‐layer method
Author(s) -
Kausel Eduardo
Publication year - 2004
Publication title -
international journal for numerical methods in engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.421
H-Index - 168
eISSN - 1097-0207
pISSN - 0029-5981
DOI - 10.1002/nme.1067
Subject(s) - interpolation (computer graphics) , layer (electronics) , stress (linguistics) , field (mathematics) , thin layer , power (physics) , structural engineering , mechanics , mathematical analysis , mathematics , materials science , motion (physics) , physics , engineering , classical mechanics , composite material , linguistics , philosophy , quantum mechanics , pure mathematics
A method is described by means of which accurate strains and stresses can be obtained for problems of wave motion in laminated media modelled with the thin layer method (TLM), a semi‐discrete procedure that combines the power of finite elements with that of analytical solutions. It is shown that when the displacements in the TLM are combined with the consistent stresses at the layer interfaces, strains and stresses anywhere in the medium can be obtained with the same level of accuracy as the displacements. The proposed method thus circumvents the intrinsic problem that arises when strains are obtained via differentiation. As a bonus, it also renders the stresses continuous across layer interfaces, which is not the case when stresses are obtained via differentiation of the primary interpolation field. Copyright © 2004 John Wiley & Sons, Ltd.