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A survey of efficient reliability computation using disjoint products approach
Author(s) -
Rai Suresh,
Veeraraghavan Malathi,
Trivedi Kishor S.
Publication year - 1995
Publication title -
networks
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.977
H-Index - 64
eISSN - 1097-0037
pISSN - 0028-3045
DOI - 10.1002/net.3230250308
Subject(s) - disjoint sets , reliability (semiconductor) , computation , computer science , mathematical optimization , algorithm , mathematics , combinatorics , power (physics) , physics , quantum mechanics
Several algorithms have been developed to solve the reliability problem for nonseries‐parallel networks using the sum of disjoint products (SDP) approach. This paper provides a general framework for most of these techniques. It reviews methods that help improve computer time and memory requirements in reliability computation. These parameters are generally used to compare SDP algorithms. We also overview three multiple variable inversion algorithms that result in sum of disjoint products expressions with fewer terms than that of algorithms that use only a single‐variable inversion. One common network is solved for two‐terminal network reliability using each of these algorithms. Finally, we have provided a comparison among these techniques.