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Most reliable double loop networks in survival reliability
Author(s) -
Hu X. D.,
Hwang F. K.,
Li WenCh'Ing Winnie
Publication year - 1993
Publication title -
networks
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.977
H-Index - 64
eISSN - 1097-0037
pISSN - 0028-3045
DOI - 10.1002/net.3230230502
Subject(s) - reliability (semiconductor) , loop (graph theory) , node (physics) , computer science , double loop , graph , mathematics , topology (electrical circuits) , combinatorics , engineering , physics , power (physics) , process management , structural engineering , quantum mechanics
Double loop networks have been intensively studied as interconnecting networks. However, the reliability analysis of such networks has hit a snag since the usual measure of reliability, the graph connectivity, is completely powerless as all double loops, if connected, are 2‐connected. Recently, Hwang and Li introduced a new analysis by partitioning cutsets into isolated and nonisolated ones and gave results on both types. Along the same line, we extent their results to the survival reliability model by showing that when each node fails independently with a very small probability, G (1, 1 + [ n /2]) is the most reliable connected double loop network except when n = 3 and 9, in which case G (1, 2) is the most reliable. © 1993 by John Wiley & Sons, Inc.