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Global planning of accelerated degradation tests based on exponential dispersion degradation models
Author(s) -
Lee IChen,
Tseng ShengTsaing,
Hong Yili
Publication year - 2020
Publication title -
naval research logistics (nrl)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.665
H-Index - 68
eISSN - 1520-6750
pISSN - 0894-069X
DOI - 10.1002/nav.21923
Subject(s) - degradation (telecommunications) , computer science , mathematical optimization , reliability (semiconductor) , test plan , exponential function , plan (archaeology) , reliability engineering , dispersion (optics) , sample (material) , mathematics , statistics , engineering , telecommunications , mathematical analysis , power (physics) , physics , chemistry , archaeology , optics , chromatography , quantum mechanics , weibull distribution , history
The accelerated degradation test (ADT) is an efficient tool for assessing the lifetime information of highly reliable products. However, conducting an ADT is very expensive. Therefore, how to conduct a cost‐constrained ADT plan is a great challenging issue for reliability analysts. By taking the experimental cost into consideration, this paper proposes a semi‐analytical procedure to determine the total sample size, testing stress levels, the measurement frequencies, and the number of measurements (within a degradation path) globally under a class of exponential dispersion degradation models. The proposed method is also extended to determine the global planning of a three‐level compromise plan. The advantage of the proposed method not only provides better design insights for conducting an ADT plan, but also provides an efficient algorithm to obtain a cost‐constrained ADT plan, compared with conventional optimal plans by grid search algorithms.