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Two‐stage component test plans for testing the reliability of a series system
Author(s) -
Vellaisamy P.,
Sankar S.
Publication year - 2002
Publication title -
naval research logistics (nrl)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.665
H-Index - 68
eISSN - 1520-6750
pISSN - 0894-069X
DOI - 10.1002/nav.1051
Subject(s) - component (thermodynamics) , reliability (semiconductor) , test plan , series (stratigraphy) , computer science , reliability engineering , genetic algorithm , test (biology) , mathematical optimization , plan (archaeology) , mathematics , statistics , engineering , weibull distribution , power (physics) , history , paleontology , physics , archaeology , quantum mechanics , biology , thermodynamics
A system reliability is often evaluated by individual tests of components that constitute the system. These component test plans have advantages over complete system based tests in terms of time and cost. In this paper, we consider the series system with n components, where the lifetime of the i ‐th component follows exponential distribution with parameter λ i . Assuming test costs for the components are different, we develop an efficient algorithm to design a two‐stage component test plan that satisfies the usual probability requirements on the system reliability and in addition minimizes the maximum expected cost. For the case of prior information in the form of upper bounds on λ i 's, we use the genetic algorithm to solve the associated optimization problems which are otherwise difficult to solve using mathematical programming techniques. The two‐stage component test plans are cost effective compared to single‐stage plans developed by Rajgopal and Mazumdar. We demonstrate through several numerical examples that our approach has the potential to reduce the overall testing costs significantly. © 2002 John Wiley & Sons, Inc. Naval Research Logistics, 49: 95–116, 2002; DOI 10.1002/nav.1051