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A model for step‐stress accelerated life testing
Author(s) -
Dharmadhikari A.D.,
Rahman Md. Monsur
Publication year - 2003
Publication title -
naval research logistics (nrl)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.665
H-Index - 68
eISSN - 1520-6750
pISSN - 0894-069X
DOI - 10.1002/nav.10088
Subject(s) - accelerated life testing , weibull distribution , stress testing (software) , reliability (semiconductor) , log normal distribution , computer science , parametric statistics , maximum likelihood , stress (linguistics) , reliability engineering , parametric model , scale parameter , econometrics , statistics , mathematics , engineering , power (physics) , physics , linguistics , philosophy , quantum mechanics , programming language
Modern technology is producing high reliability products. Life testing for such products under normal use condition takes a lot of time to obtain a reasonable number of failures. In this situation a step‐stress procedure is preferred for accelerated life testing. In this paper we assume a Weibull and Lognormal model whose scale parameter depends upon the present level as well as the age at the entry in the present stress level. On the basis of that we propose a parametric model to the life distribution for step‐stress testing and suggest a suitable design to estimate the parameters involved in the model. A simulation study has been done by the proposed model based on maximum likelihood estimation. © 2003 Wiley Periodicals, Inc. Naval Research Logistics, 2003