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Skewness correction X̄ and R charts for skewed distributions
Author(s) -
Chan Lai K.,
Cui Heng J.
Publication year - 2003
Publication title -
naval research logistics (nrl)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.665
H-Index - 68
eISSN - 1520-6750
pISSN - 0894-069X
DOI - 10.1002/nav.10077
Subject(s) - control chart , skewness , statistics , \bar x and r chart , x bar chart , mathematics , weibull distribution , shewhart individuals control chart , log normal distribution , control limits , binomial distribution , ewma chart , computer science , process (computing) , operating system
This paper proposes a skewness correction (SC) method for constructing the $\bar{X}$ and R control charts for skewed process distributions. Their asymmetric control limits (about the central line) are based on the degree of skewness estimated from the subgroups, and no parameter assumptions are made on the form of process distribution. These charts are simply adjustments of the conventional Shewhart control charts. Moreover, the $\bar{X}$ chart is almost the same as the Shewhart $\bar{X}$ chart if the process distribution is known to be symmetrical. The new charts are compared with the Shewhart charts and weighted variance (WV) control charts. When the process distribution is in some neighborhood of Weibull, lognormal, Burr or binomial family, simulation shows that the SC control charts have Type I risk (i.e., probability of a false alarm) closer to 0.27% of the normal case. Even in the case where the process distribution is exponential with known mean, not only the control limits and Type I risk, but also the Type II risk of the SC charts are closer to those of the exact $\bar{X}$ and R charts than those of the WV and Shewhart charts. © 2003 Wiley Periodicals, Inc. Naval Research Logistics 50: 555–573, 2003