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Reliability bounds for the NBUE distributions
Author(s) -
Cheng Kan,
Lam Yeh
Publication year - 2002
Publication title -
naval research logistics (nrl)
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.665
H-Index - 68
eISSN - 1520-6750
pISSN - 0894-069X
DOI - 10.1002/nav.10035
Subject(s) - reliability (semiconductor) , upper and lower bounds , constructive proof , conjecture , constructive , class (philosophy) , mathematics , combinatorics , distribution (mathematics) , moment (physics) , discrete mathematics , computer science , physics , mathematical analysis , power (physics) , artificial intelligence , process (computing) , quantum mechanics , operating system , classical mechanics
In this paper, we study upper and lower bounds on the reliability in new better than used in expectation (NBUE) life distribution class with fixed first two moments. By a constructive proof, we determine the upper bounds on the reliability analytically in different regions and show that these bounds are sharp. For the lower bounds, similar results are obtained except in one region. For that region, a conjecture is given for further study. © 2002 Wiley Periodicals, Inc. Naval Research Logistics 49: 781–797, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/nav.10035