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Display Metrology: New Tools and Big Ideas
Author(s) -
Fiske Tom
Publication year - 2020
Publication title -
information display
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.182
H-Index - 20
eISSN - 2637-496X
pISSN - 0362-0972
DOI - 10.1002/msid.1152
Subject(s) - metrology , quality (philosophy) , computer science , nanotechnology , engineering , materials science , optics , physics , quantum mechanics
If display metrology is the industry's ground truth, standards are the ground. Consequently, both were well‐represented at Display Week 2020. Here, we highlight the innovative instruments and important new research on metrology, standards, and image quality that emerged from the symposium and exhibit.