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A DE‐embedding technique for reflection‐based S‐parameter measurements of HMICs and MMICs
Author(s) -
Ghannouchi F. M.,
Beauregard F.,
Hajji R.,
Brodeur A.
Publication year - 1995
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650100408
Subject(s) - calibration , network analyzer (electrical) , reflection (computer programming) , reflection coefficient , scattering parameters , microwave , embedding , electronic engineering , port (circuit theory) , transmission (telecommunications) , electrical engineering , computer science , engineering , physics , telecommunications , quantum mechanics , artificial intelligence , programming language
A generalized calibration and de‐embedding technique for reflection‐based S‐parameter measurements of microwave devices is proposed. This technique allows two‐port calibration of a network analyzer directly from the embedded reflection coefficient measurements. This technique is a general one, in the sense that it can be implemented in network analyzers with or without transmission measurement capabilities. © 1995 John Wiley & Sons, Inc.