A DE‐embedding technique for reflection‐based S‐parameter measurements of HMICs and MMICs | Zendy

Ghannouchi F. M. | Zendy; Beauregard F. | Zendy; Hajji R. | Zendy; Brodeur A. | Zendy

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A DE‐embedding technique for reflection‐based S‐parameter measurements of HMICs and MMICs

Author(s) -

Ghannouchi F. M.,

Beauregard F.,

Hajji R.,

Brodeur A.

Publication year - 1995

Publication title -

microwave and optical technology letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.304

H-Index - 76

eISSN - 1098-2760

pISSN - 0895-2477

DOI - 10.1002/mop.4650100408

Subject(s) - calibration , network analyzer (electrical) , reflection (computer programming) , reflection coefficient , scattering parameters , microwave , embedding , electronic engineering , port (circuit theory) , transmission (telecommunications) , electrical engineering , computer science , engineering , physics , telecommunications , quantum mechanics , artificial intelligence , programming language

A generalized calibration and de‐embedding technique for reflection‐based S‐parameter measurements of microwave devices is proposed. This technique allows two‐port calibration of a network analyzer directly from the embedded reflection coefficient measurements. This technique is a general one, in the sense that it can be implemented in network analyzers with or without transmission measurement capabilities. © 1995 John Wiley & Sons, Inc.

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