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Fast iterative algorithm for the fine detail analysis of planar scatterers
Author(s) -
Finkelstein Bezalel,
Kastner Raphael
Publication year - 1995
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650100209
Subject(s) - planar , convergence (economics) , algorithm , iterative method , computer science , mathematical optimization , mathematics , computer graphics (images) , economics , economic growth
A very efficient iterative algorithm is presented for the analysis of planar scatterers at the very fine detail regime. The mechanisms causing slow convergence in other techniques have been identified and corrected. The resultant algorithm converges very fast for problems with fine details sampled faster than 0.001°, where other methods fail. © 1995 John Wiley & Sons, Inc.