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Parameter estimation of frequency‐dependent scatterers using superresolution techniques
Author(s) -
Odendaal J. W.,
van Jaarsveld P. A.
Publication year - 1995
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650100202
Subject(s) - scattering , amplitude , superresolution , physics , computational physics , optics , field (mathematics) , frequency dependence , acoustics , mathematics , computer science , image (mathematics) , nuclear magnetic resonance , artificial intelligence , pure mathematics
A technique to estimate the frequency dependence of electromagnetic scattering centers is proposed. The technique employs a superresolution algorithm to estimate poles corresponding to the various scattering centers contributing to the total backscattered field. A relationship between the amplitudes of the estimated poles and the frequency dependence of the scatterers is derived. The technique is applied to estimate the frequency dependence of simulated and measured backscattered field data. © 1995 John Wiley & Sons, Inc.