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Analytical formulas for calculating the effective dielectric constants of coplanar lines for OIC applications
Author(s) -
Zhu Ning Hua,
Pun Edwin Yue Bun,
Li Jia Xu
Publication year - 1995
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650090419
Subject(s) - conformal map , dielectric , point (geometry) , matching (statistics) , point set registration , computational physics , materials science , high κ dielectric , electronic engineering , optoelectronics , physics , mathematical analysis , mathematics , engineering , geometry , statistics
We use conformal mapping techniques to derive the quasianalytical formulas for calculating the effective dielectric constants of coplunar lines on LiNbO 3 substrates having a buffer layer. Our calculations agree well with the results obtained using the point‐matching method. © 1995 John Wiley & Sons, Inc.