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Design, realization, and evaluation of a millimeter‐wave network analyzer using a single six‐port reflectometer
Author(s) -
Abou Chahine S.,
Huyart B.,
Bergeault E.,
Jallet L.
Publication year - 1995
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650080209
Subject(s) - network analyzer (electrical) , spectrum analyzer , calibration , scattering parameters , port (circuit theory) , realization (probability) , optical time domain reflectometer , electronic engineering , extremely high frequency , device under test , engineering , computer science , electrical engineering , telecommunications , physics , fiber optic sensor , statistics , mathematics , quantum mechanics , optical fiber , graded index fiber
This work presents an automatic network analyzer (ANA) using a single six‐port reflectometer in the W frequency band (75‐110 GHz). Its analysis, design, and testing are described. A calibration procedure requiring two standards and a new calibration technique are used to determine the full scattering parameters of the device under test (DUT). Finally, a comparison between experimental results performed with the six‐port network analyzer and the other measurement systems available in the W frequency band is presented.