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The two‐point target technique for free‐space permittivity measurements of lossy dielectrics
Author(s) -
Yin Hongcheng,
Zhang Wenxun,
Xiao Zhihe,
Huang Peikang
Publication year - 1994
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650071107
Subject(s) - lossy compression , permittivity , dielectric , point (geometry) , optics , relative permittivity , phase (matter) , materials science , free space , mathematical analysis , physics , mathematics , geometry , optoelectronics , statistics , quantum mechanics
A new technique for permittivity measurements of lossy dielectrics is presented. It is based on the measurements of backscattering cross section and linear deviation (angular glint) of a two‐point target, consisting of a conducting sphere with a dielectric one or a conducting one coated by the material under test. Because the linear deviation is proportional to the derivative of phase versus aspect angle, this technique overcomes the difficulty encountered in accurately measuring the phase in free space. Moreover, the choice of spherical targets, makes positioning less critical. The effectiveness of such a technique is verified by numerical simulations and measurements. © 1994 John Wiley & Sons, Inc.