z-logo
Premium
Analysis of microstrip multiport junctions using the multimode boundary integral method
Author(s) -
Gan Y. B.,
Leong M. S.,
Kool P. S.
Publication year - 1994
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650070110
Subject(s) - multi mode optical fiber , planar , microstrip , boundary (topology) , integral equation , coupling (piping) , mathematical analysis , matrix (chemical analysis) , series (stratigraphy) , physics , topology (electrical circuits) , mathematics , electronic engineering , engineering , optics , computer science , materials science , electrical engineering , mechanical engineering , optical fiber , geology , paleontology , computer graphics (images) , composite material
The Boundary integral method (BIM) is applied to a number of planar microstrip multiport junctions. The E fields for coupling ports are expressed as multimode series, enabling direct calculation of S parameters from the resulting matrix equation. Results obtained for cross junctions, T junctions, Y junctions, and 90° bends agree very well with those obtained from full‐wave analysis and other methods. © 1994 John Wiley & Sons, Inc.

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom