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(FD) 2 ‐TD and experimental comparison for a cylindrical cavity loaded with lossy dielectric
Author(s) -
Hum P. J.,
Leong M. S.,
Kooi P. S.,
Yeo T. S.
Publication year - 1993
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650061514
Subject(s) - admittance , dielectric , aperture (computer memory) , optics , coaxial , reflection (computer programming) , materials science , lossy compression , reflection coefficient , coaxial cable , excited state , finite difference time domain method , debye , electrical impedance , physics , acoustics , electrical engineering , atomic physics , mathematics , optoelectronics , engineering , condensed matter physics , conductor , statistics , computer science , composite material , programming language , quantum mechanics
In this article, the frequency‐dependent finite‐difference time‐domain (FD) 2 ‐TD technique is used to analyze a coaxial‐line excited cylindrical cavity loaded with an electrically lossy dielectric, modeled by a first‐order Debye expression. Results obtained for the reflected voltage in the coaxial line are Fourier transformed to yield the reflection coefficient Γ and input admittance at the coaxial aperture. Experimental measurements for Γ show good agreement with predicted (FD) 2 ‐TD results.
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