Premium
A perturbation approach to the analysis of index ellipsoid deformations in biaxial and uniaxial media
Author(s) -
Faria J. A. Brandao
Publication year - 1993
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650061114
Subject(s) - ellipsoid , principal axis theorem , refractive index , perturbation (astronomy) , anisotropy , optics , piezoelectricity , mathematical analysis , physics , mathematics , geometry , acoustics , quantum mechanics , astronomy
Under the disturbing influence of photoelastic, piezoelectric, or electrooptic effects, anisotropic media have their natural behavior modified, the modification being described by a change in both the dimensions and orientation of the index ellipsoid. A first‐order perturbation method useful for determining the perturbed index ellipsoid based on the unperturbed one is developed. Results concerning the new principal axes and principal refractive indices of the perturbed optical medium are presented. © 1993 John Wiley & Sons, Inc.