Premium
ANALYTICAL BEHAVIOR OF THE SURFACE CHARGE DENSITY ON A CONDUCTOR WITH TWO CONSECUTIVE EDGES WITH RIGHT ANGLES
Author(s) -
And Frank Olyslager,
de Zutter Daniël
Publication year - 1993
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650061005
Subject(s) - conductor , surface (topology) , charge density , transformation (genetics) , geometry , mathematical analysis , charge (physics) , optics , physics , mathematics , chemistry , quantum mechanics , biochemistry , gene
We study the singular behavior of the surface charge density at the corner of a thin perfect conductor with rectangular cross section taking into account the presence of a nearby corner. Analytical expressions by means of a Schwartz‐Christoffel transformation for the behavior of the surface charge density are obtained resulting from the interaction of both corners. This behavior is useful for the choice of basis functions in MoM techniques used to analyze strip lines and microstrips. © 1993 John Wiley & Sons, Inc.