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Near‐field pattern diffracted by a spherical cavity in a denser medium
Author(s) -
And JinSeob Kang,
Ra JungWoong
Publication year - 1993
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650060911
Subject(s) - diffraction , radius , optics , transverse plane , dielectric , plane (geometry) , field (mathematics) , wavelength , electric field , physics , materials science , near and far field , geometry , optoelectronics , engineering , mathematics , computer security , structural engineering , quantum mechanics , computer science , pure mathematics
A copolarized electric field diffracted by a spherical cavity in a denser dielectric medium is analyzed in the forward near‐field region when the wavelength is comparable to one half the cavity radius. It is shown that double nulls and dips exist in the measurement plane transverse to the propagating direction of the incident field, and their dependences on the frequency, the distance of the measurement plane, and the measurement angles are analyzed. © 1993 John Wiley & Sons, Inc.