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An equivalent circuit model of the optical probe in electro‐optical sampling systems
Author(s) -
Song Jian,
Conn David,
Wu Xiaohua,
Nickerson Kent
Publication year - 1993
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650060812
Subject(s) - equivalent circuit , sampling (signal processing) , coplanar waveguide , field (mathematics) , electronic engineering , electrical element , engineering , materials science , optics , physics , mathematics , electrical engineering , voltage , telecommunications , detector , microwave , pure mathematics
Abstract An equivalent circuit approach to modeling of the electro‐optic sampling structure is proposed for the first time. The influence of the optical probe to S parameters of the coplanar waveguide test structure is modeled by an equivalent circuit consisting of the analytic approximations and lumped circuit elements. The model coefficients are optimized by fitting the full‐wave field simulation results. The model is dependent on the test structure geometry and material parameters.