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An efficient analysis of anisotropic multiconductor‐multilayered mics using the spectral‐domain‐block‐transfer‐matrix method
Author(s) -
And Yinchao Chen,
Beker Benjamin
Publication year - 1993
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650060810
Subject(s) - transfer matrix , matrix (chemical analysis) , anisotropy , transfer matrix method (optics) , frequency domain , transmission line , microwave , block (permutation group theory) , domain (mathematical analysis) , electronic engineering , mathematical analysis , physics , materials science , mathematics , optics , engineering , computer science , telecommunications , geometry , composite material , computer vision
In this article the spectral‐domain approach and the transfer matrix technique are extended to analyze multilayered‐multiconductor anisotropic microwave and millimeter‐wave integrated circuits. The spectral‐domain formulation only uses two components of the electric field that are tangential to interfaces between adjacent layers. A 2×2 block matrix is defined for every interface to relate the coefficients of the fields in all stratified layers of the guiding structure. The use of the proposed spectral‐domain‐block‐transfer‐matrix method is illustrated for both single and coupled three‐layer bilateral transmission lines. In addition, a detailed material parameter study is performed to examine the effects of individual anisotropic layers on the propagation characteristics of the line. © 1993 John Wiley & Sons, Inc.