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Analysis of uncovered two‐layer three‐coupled microstrip lines on anisotropic substrates
Author(s) -
And Chulhun Seo,
Lee Choong Woong
Publication year - 1993
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650060713
Subject(s) - microstrip , anisotropy , electrical impedance , layer (electronics) , frequency domain , physics , line (geometry) , computational physics , acoustics , materials science , electronic engineering , mathematical analysis , optics , engineering , mathematics , geometry , quantum mechanics , composite material
General expressions of the variational method are obtained for the quusistatic analysis of uncovered two‐layer three‐coupled microstrip lines. The frequency‐dependent parameter is obtained by employing the extended spectral domain in the full‐wave analysis. Accurate numerical results are presented for the line capacitances to the various widths of the first layer of two‐layer three‐coupled microstrip lines on anisotropic substrates. The propagation constants and the characteristic impedances are obtained for various frequencies. © 1993 John Wiley & Sons, Inc.