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Static characterization of offset asymmetric microstrip GAP discontinuities
Author(s) -
Martel Jesus,
Boix Rafael R.,
Horno Manuel
Publication year - 1993
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650060503
Subject(s) - discontinuity (linguistics) , classification of discontinuities , strips , offset (computer science) , microstrip , materials science , anisotropy , equivalent circuit , optoelectronics , electronic engineering , physics , engineering , electrical engineering , mathematics , mathematical analysis , composite material , optics , computer science , voltage , programming language
The capacitances appearing in the equivalent circuit of the offset asymmetric microstrip gap discontinuity are determined in the case in which the metallizations of the discontinuity are embedded in a multilayered anisotropic substrate. The excess charge densities on the conducting strips of the discontinuity are obtained by using the Galerkin method in the spectral domain. A wide variety of results is provided to demonstrate the generality of the study carried out. © 1993 John Wiley & sons, Inc.