A coaxial test fixture for characterizing low‐impedance microwave two‐terminal devices | Zendy

Monahan Gregory P. | Zendy; Morris Arthur S. | Zendy; Steer Michael B. | Zendy

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A coaxial test fixture for characterizing low‐impedance microwave two‐terminal devices

Author(s) -

Monahan Gregory P.,

Morris Arthur S.,

Steer Michael B.

Publication year - 1993

Publication title -

microwave and optical technology letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.304

H-Index - 76

eISSN - 1098-2760

pISSN - 0895-2477

DOI - 10.1002/mop.4650060314

Subject(s) - test fixture , fixture , terminal (telecommunication) , coaxial , electrical impedance , calibration , microwave , diode , engineering , electrical engineering , electronic engineering , materials science , mechanical engineering , physics , telecommunications , quantum mechanics

A technique using a coaxial diode test fixture for the mount‐independent characterization of potentially unstable two‐terminal devices is presented. A standard three‐terminal calibration procedure using reference packages is used to calibrate to the surface of the packaged device. The test fixture is designed to present a low, nonresonant impedance to the device so that measurement resolution is enhanced. The characterization of an IMPATT diode is presented as an example. © 1993 John Wiley & sons, Inc.

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