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Thin‐film boundary conditions
Author(s) -
Jeng ShyhKang,
Lee ShungWu
Publication year - 1992
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650051310
Subject(s) - boundary (topology) , boundary value problem , mathematical analysis , finite element method , resistive touchscreen , electrical conductor , boundary element method , mathematics , integral equation , engineering , electrical engineering , structural engineering
Abstract A set of boundary conditions for general thin‐film structures is derived, which includes special cases of a resistive card and a thin coating over perfect electric conductors. The use of such boundary conditions in an analytical method, the method of moments, or the finite element method offers three distinct advantages: (i) the boundary conditions are much simpler, which makes the integral equation or the variational equation formulation simpler, (ii) the number of unknowns is reduced, and (iii) the numerical solution is more stable. © 1992 John Wiley & Sons, Inc.