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Analysis of a microstrip step discontinuity fabricated on a metal‐insulator‐semiconductor (MIS) substrate
Author(s) -
Livernols Thomas G.,
East Jack R.
Publication year - 1992
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650051303
Subject(s) - discontinuity (linguistics) , microstrip , space mapping , materials science , scattering , insulator (electricity) , surface (topology) , substrate (aquarium) , integral equation , semiconductor , electronic engineering , optoelectronics , optics , physics , mathematical analysis , engineering , geometry , mathematics , geology , oceanography
A space‐domain coupled integral equation analysis is used to compute the two‐dimensional surface current distribution on a basic microstrip step discontinuity fabricated on an MIS substrate. The two‐port scattering parameters are computed from the surface current and their accuracy is verified through comparison with a measured data. © 1992 John Wiley & Sons, Inc.