Analysis of a microstrip step discontinuity fabricated on a metal‐insulator‐semiconductor (MIS) substrate | Zendy

Livernols Thomas G. | Zendy; East Jack R. | Zendy

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Analysis of a microstrip step discontinuity fabricated on a metal‐insulator‐semiconductor (MIS) substrate

Author(s) -

Livernols Thomas G.,

East Jack R.

Publication year - 1992

Publication title -

microwave and optical technology letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.304

H-Index - 76

eISSN - 1098-2760

pISSN - 0895-2477

DOI - 10.1002/mop.4650051303

Subject(s) - discontinuity (linguistics) , microstrip , space mapping , materials science , scattering , insulator (electricity) , surface (topology) , substrate (aquarium) , integral equation , semiconductor , electronic engineering , optoelectronics , optics , physics , mathematical analysis , engineering , geometry , mathematics , geology , oceanography

A space‐domain coupled integral equation analysis is used to compute the two‐dimensional surface current distribution on a basic microstrip step discontinuity fabricated on an MIS substrate. The two‐port scattering parameters are computed from the surface current and their accuracy is verified through comparison with a measured data. © 1992 John Wiley & Sons, Inc.

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