A novel method for measuring the aluminum concentration in Al x Ga 1−x As alloy system | Zendy

Chuang WeiChing | Zendy; Chang WenChung | Zendy; Chen JiahnAnn | Zendy; Lee WeiYu | Zendy

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A novel method for measuring the aluminum concentration in Al x Ga 1−x As alloy system

Author(s) -

Chuang WeiChing,

Chang WenChung,

Chen JiahnAnn,

Lee WeiYu

Publication year - 1992

Publication title -

microwave and optical technology letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.304

H-Index - 76

eISSN - 1098-2760

pISSN - 0895-2477

DOI - 10.1002/mop.4650051020

Subject(s) - alloy , x ray absorption spectroscopy , aluminium , spectral line , materials science , band gap , wax , absorption spectroscopy , absorption (acoustics) , range (aeronautics) , optoelectronics , analytical chemistry (journal) , optics , metallurgy , chemistry , physics , composite material , chromatography , astronomy

A simple method for obtaining optical transmission spectra of Al x Ga 1‐x As epilayer by translucent AB wax is presented. Absorption spectra are measured for x in the range of 0 ≤ x ≤ 0.8. For the Γ 15v ‐Γ 1C energy bandgap, the aluminum concentrations, calculated from the experimental data with a formula derived by the ray‐optics method, are in good agreement with those reported. © 1992 John Wiley & Sons, Inc.

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