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A novel method for measuring the aluminum concentration in Al x Ga 1−x As alloy system
Author(s) -
Chuang WeiChing,
Chang WenChung,
Chen JiahnAnn,
Lee WeiYu
Publication year - 1992
Publication title -
microwave and optical technology letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.304
H-Index - 76
eISSN - 1098-2760
pISSN - 0895-2477
DOI - 10.1002/mop.4650051020
Subject(s) - alloy , x ray absorption spectroscopy , aluminium , spectral line , materials science , band gap , wax , absorption spectroscopy , absorption (acoustics) , range (aeronautics) , optoelectronics , analytical chemistry (journal) , optics , metallurgy , chemistry , physics , composite material , chromatography , astronomy
A simple method for obtaining optical transmission spectra of Al x Ga 1‐x As epilayer by translucent AB wax is presented. Absorption spectra are measured for x in the range of 0 ≤ x ≤ 0.8. For the Γ 15v ‐Γ 1C energy bandgap, the aluminum concentrations, calculated from the experimental data with a formula derived by the ray‐optics method, are in good agreement with those reported. © 1992 John Wiley & Sons, Inc.