A technique for the large‐signal characterization of transistors | Zendy

Tsang Kim Fung | Zendy; Yip Peter C. L. | Zendy; Morgan Gwyn B. | Zendy

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A technique for the large‐signal characterization of transistors

Author(s) -

Tsang Kim Fung,

Yip Peter C. L.,

Morgan Gwyn B.

Publication year - 1992

Publication title -

microwave and optical technology letters

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.304

H-Index - 76

eISSN - 1098-2760

pISSN - 0895-2477

DOI - 10.1002/mop.4650051013

Subject(s) - characterization (materials science) , transistor , nonlinear system , electronic engineering , signal (programming language) , materials science , electrical engineering , engineering , computer science , physics , nanotechnology , voltage , quantum mechanics , programming language

A novel method for the characterization of transistors operating in the nonlinear region has been developed. A new measurement method is proposed and the formulation for the characterization has been developed. Calculated results based on the proposed method are promising when compared to measured data. © 1992 John Wiley & Sons, Inc.

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